Malykhin, S.V.; Makhlai, V.A.; Surovitskiy, S.V.; Garkusha, I.E.; Herashchenko, S.S.; Kondratenko, V.V.; Kopylets, I.A.; Zubarev, E.N.; Borisova, S.S.; Fedchenko, A.V.
(Вопросы атомной науки и техники, 2020)
X-ray diffraction and SEM microscopy were used to study the structural and phase changes in a thin film obtained by magnetron sputtering of a Ti52Zr30Ni18 target (at.%) on a steel substrate under the radiation-thermal ...